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辐照环境用低暗计数单光子探测装置及方法

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:杨孟,caiwenqi,renjigang,YinJuan,曹蕾,pengchengzhi,panjianwei

  • Patent description:发明

  • Application Number:201711119157.6

  • Number of Inventors:8

  • Service Invention or Not:no

  • Publication Date:2018-06-15

  • First Author:liaoshengkai


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