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Current position: Home >> Scientific Research >> Patents
一种纳米薄膜的测量方法及装置

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Affilication of Author(s):中国科学技术大学

Disigner of the Invention:宫俊波,dairucheng,wangzhongping,dingzejun

Patent description:发明

Application Number:201310743478.9

Number of Inventors:5

Service Invention or Not:no

Publication Date:2014-04-23

Authorization Date:2017-01-11

First Author:zhangzengming