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Simulation study of the atomic resolution secondary electron imaging

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  • Impact Factor:1.665

  • DOI number:10.1002/sia.5565

  • Journal:SURFACE AND INTERFACE ANALYSIS

  • Correspondence Author:dingzejun

  • Document Code:000345574200042

  • Volume:46

  • Issue:12-13

  • Page Number:1296-1300

  • ISSN No.:0142-2421

  • Translation or Not:no

  • Date of Publication:2014-11-30

  • Included Journals:SCI

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