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一种测量纳米器件输运性质的系统和方法

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:qinxi,肖庆,chengguanglei,dujiangfeng

  • Patent description:发明申请

  • Application Number:201911133287.4

  • Number of Inventors:5

  • Service Invention or Not:no

  • First Author:赵宇曦


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