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基于激光片光成像的粒子场全场测量方法及其装置

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Affilication of Author(s):中国科学技术大学

Disigner of the Invention:liaoguangxuan,qinjun,fanweicheng,wuxiaoping

Patent description:发明

Application Number:02113133.3

Number of Inventors:5

Service Invention or Not:no

Publication Date:2003-12-31

Authorization Date:2006-04-19

First Author:Xishi WANG