中国科学技术大学冯志华--中文主页-- 13、Wei Li, Yang Ye, Kang Zhang, Zhihua Feng: A Thickness Measurement System for Metal Films Based on Eddy-Current Method With Phase Detection. IEEE Transactions on Industrial Electronics 01/2017; PP(99):1-1., DOI:10.1109/TIE.2017.2650861

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13、Wei Li, Yang Ye, Kang Zhang, Zhihua Feng: A Thickness Measurement System for Metal Films Based on Eddy-Current Method With Phase Detection. IEEE Transactions on Industrial Electronics 01/2017; PP(99):1-1., DOI:10.1109/TIE.2017.2650861

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