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基于X射线几何投影莫尔条纹的精密位移测量装置及方法

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Affilication of Author(s):中国科学技术大学

Disigner of the Invention:王圣浩,wangzhili,gaokun,韩华杰,张灿,杨蒙

Patent description:发明

Application Number:201410153744.7

Number of Inventors:7

Service Invention or Not:no

Publication Date:2014-07-02

Authorization Date:2017-01-04

First Author:wuziyu

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