Affilication of Author(s):中国科学技术大学
Disigner of the Invention:张涛,guoguangcan
Patent description:发明
Application Number:03132014.7
Number of Inventors:3
Service Invention or Not:no
Publication Date:2005-01-19
Authorization Date:2009-04-29
First Author:hanzhengfu
Pre One:一种极低温下半导体量子点低噪测量系统
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