洪义麟
Click:
The Founding Time:..
The Last Update Time:..
· Scan attention
·Patents
一种平面基底变间距光栅的线密度测试系统及测试方法
Release time:2021-07-24 Hits:
Affilication of Author(s): 中国科学技术大学
Disigner of the Invention: 林达奎,liuying,chenhuoyao,hongyilin
Patent description: 发明公开
Application Number: 201910501496.3
Number of Inventors: 5
Service Invention or Not: no
Publication Date: 2019-08-27
First Author: liuzhengkun