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一种用于原位结构检测的高分子薄膜材料拉伸装置及其实验方法

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:周韦明,洪执华,liuliangbao,李海龙,周卫青,wangxiao

  • Patent description:发明

  • Application Number:201210480426.2

  • Number of Inventors:7

  • Service Invention or Not:no

  • Publication Date:2013-04-03

  • First Author:liliangbin

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