中国科学技术大学 Peng Li--Home-- Z. Zhou, U. Guin, P. Li*, and V. D. Agrawal, Fault modeling and test generation for technology-specific defects of skyrmion logic circuits

Z. Zhou, U. Guin, P. Li*, and V. D. Agrawal, Fault modeling and test generation for technology-specific defects of skyrmion logic circuits

Release time:2022-07-13

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Abstract:: This paper advances the recent results on testing skyrmion logic circuits, which recently gained popularity as an emerging technology. A skyrmion circuit differs significantly from the existing CMOS circuit in physical structure and operation mechanisms. The previous work identified 19 defect types and modeled them as either a stuck-at fault, no-fault causing no error, or a technology-specific defect requiring special consideration. The previous work was limited to those defects that map onto single stuck-at faults. The present work addresses the class of technology-specific defects that were not discussed before. Our defect mapping onto an analyzable fault model uses extensions of fault equivalence and fault dominance principles. We model the defects as transition faults whose test generation is supported in the logic-level EDA systems. All such defects require two-pattern tests, except one defect, missing annihilation notch of OR gate, that needs three patterns. These require test generation for constrained stuck-at fault, generally available in EDA systems. The reported results show that majority of the defects of skyrmionbased circuits can be detected using the proposed test generation approach; few exceptions are defects that map through dominance onto faults rendered redundant due to the circuit structure.