个人信息Personal Information
特任教授
电子邮箱：
职务：Professor
办公地点：No.96 JinZhai Road Baohe District, 213 Ronghe Building, North Campus Hefei, Anhui, 230026, P.R.China
联系方式：+86(0551)63607785
学位：博士
毕业院校：University of Notre Dame, USA
学科：电子科学与技术
Understanding Signatures of Emergent Magnetism in Topological Insulator/Ferrite Bilayers
点击次数：
DOI码：10.1103/PhysRevLett.128.126802
发表刊物：PHYSICAL REVIEW LETTERS
摘要：Magnetic insulator-topological insulator heterostructures have been studied in search of chiral edge states via proximity induced magnetism in the topological insulator, but these states have been elusive. We identified MgAl0.5Fe1.5O4=Bi2Se3 bilayers for a possible magnetic proximity effect. Electrical transport and polarized neutron reflectometry suggest a proximity effect, but structural data indicate a disordered interface as the origin of the magnetic response. Our results provide a strategy via correlation of microstructure with magnetic data to confirm a magnetic proximity effect.
论文类型：期刊论文
学科门类：工学
卷号：128
期号：126802
是否译文：否
发表时间：2022-01-12