Thermal diffusion and epitaxial growth of Ag in Ag/SiO2/Si probed by XRD, depth-resolved XPS, and slow positron beam
点击次数:
发表刊物:Appl. Surf. Sci. 496, 143527 (2019).
是否译文:否
Thermal diffusion and epitaxial growth of Ag in Ag/SiO2/Si probed by XRD, depth-resolved XPS, and slow positron beam
点击次数:
发表刊物:Appl. Surf. Sci. 496, 143527 (2019).
是否译文:否