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一种纳米尺度的微波磁场测量方法

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:张一幸,wangpengfei,李瑞,王成杰,qinxi,shifazhan,wangya

  • Patent description:发明

  • Application Number:201810421286.9

  • Number of Inventors:8

  • Service Invention or Not:no

  • Publication Date:2018-10-12

  • First Author:dujiangfeng


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