Login 中文
Home >>Research Focus

Application and development of SPM techniques particularly the scanning tunneling microscopy (STM) and non contact atomic force microsc  -opy (NC-AFM)

  • Application and development of SPM techniques particularly the scanning tunneling microscopy (STM) and non contact atomic force microsc-opy (NC-AFM)


  • 邵翔
Copyright © 2013 University of Science and Technology of China. Click:
  MOBILE Version

The Last Update Time:..