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DOI码：10.1364/OE.25.030259
发表刊物：Optics Express
摘要：mage registration is the key technique of optical metrologies such as digital image correlation (DIC), particle image velocimetry (PIV), and speckle metrology. Its performance depends critically on the quality of image pattern, and thus pattern optimization attracts extensive attention. In this article, a statistical model is built to optimize speckle patterns that are composed of randomly positioned speckles. It is found that the process of speckle pattern generation is essentially a filtered Poisson process. The dependence of measurement errors (including systematic errors, random errors, and overall errors) upon speckle pattern generation parameters is characterized analytically. By minimizing the errors, formulas of the optimal speckle radius are presented. Although the primary motivation is from the field of DIC, we believed that scholars in other optical measurement communities, such as PIV and speckle metrology, will benefit from these discussions.
论文类型：期刊论文
卷号：25
期号：24
页面范围：30259-30275
是否译文：否
发表时间：2017-11-17
收录刊物：SCI
发布期刊链接：https://opg.optica.org/oe/fulltext.cfm?uri=oe-25-24-30259&id=377020