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唐雷雷

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Design of Two-Dimention Interferometer for Measuring Electron Beam Transverse Sizes

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DOI number:10.4028/www.scientific.net/AMR.403-408.2732

Journal:MEMS, NANO AND SMART SYSTEMS, PTS 1-6

First Author:tangleilei

Correspondence Author:tangleilei

Document Code:000310764701206

Volume:403-408

Page Number:2732-+

ISSN No.:1022-6680

Translation or Not:no

Date of Publication:2011-11-30

Included Journals:ISTP