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王克逸

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一种利用双光谱成像进行雾场粒径平面分布测量的装置

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Affilication of Author(s):中国科学技术大学

Disigner of the Invention:张钟秀,wangkeyi,wangshengbo

Patent description:发明

Application Number:201310337431.2

Number of Inventors:4

Service Invention or Not:no

Publication Date:2013-11-20

Authorization Date:2015-09-09

First Author:liuweilai

Pre One:基于大景深条带图像投影的弯曲粗糙表面缺陷鉴别方法

Next One:一体化光纤激光准直器的制作装置