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王鹏飞

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Current position: Home >> Scientific Research >> Patents
一种纳米尺度的微波磁场测量方法

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Affilication of Author(s):中国科学技术大学

Disigner of the Invention:张一幸,wangpengfei,李瑞,王成杰,qinxi,shifazhan,wangya

Patent description:发明

Application Number:201810421286.9

Number of Inventors:8

Service Invention or Not:no

Publication Date:2018-10-12

First Author:dujiangfeng