Xishi WANG
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基于激光片光成像的粒子场全场测量方法及其装置
Release time:2021-07-23 Hits:
Affilication of Author(s): 中国科学技术大学
Disigner of the Invention: liaoguangxuan,qinjun,fanweicheng,wuxiaoping
Patent description: 发明
Application Number: 02113133.3
Number of Inventors: 5
Service Invention or Not: no
Publication Date: 2003-12-31
Authorization Date: 2006-04-19
First Author: Xishi WANG