Xishi WANG
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[10]王喜世，廖光煊，秦俊，韦亚星，范维澄，伍小平，基于激光片光成像的粒子场全场测量方法及其装置，专利号：ZL 02113133.3，授权日期：2006.4.19.
Release time:2021-07-06 Hits:
Service Invention or Not: no
Application Date: 2021-09-03
Publication Date: 2021-09-03
Authorization Date: 2021-09-03