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一种纳米尺度的微波磁场测量方法
Release time:2021-07-24 Hits:
Affilication of Author(s): 中国科学技术大学
Disigner of the Invention: 张一幸,wangpengfei,李瑞,王成杰,qinxi,shifazhan,wangya
Patent description: 发明
Application Number: 201810421286.9
Number of Inventors: 8
Service Invention or Not: no
Publication Date: 2018-10-12
First Author: dujiangfeng