Affilication of Author(s):中国科学技术大学
Disigner of the Invention:侯纪伟,wangzhongping,zhangzengming,dingzejun
Patent description:发明
Application Number:201110376731.2
Number of Inventors:5
Service Invention or Not:no
Publication Date:2012-08-29
Authorization Date:2014-07-09
First Author:zhangjianwu
Pre One:一种纳米薄膜的测量方法及装置
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