Login 中文

基于显微成像的图像灰度测量颗粒粒径的方法

Hits:

  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:李迪,liyinmei,钟敏成,wangziqiang

  • Patent description:发明

  • Application Number:201410685961.0

  • Number of Inventors:5

  • Service Invention or Not:no

  • Publication Date:2015-03-04

  • Authorization Date:2017-02-22

  • First Author:zhoujinhua


Copyright © 2013 University of Science and Technology of China. Click:
  MOBILE Version

The Last Update Time:..