一种基于光学俘获的颗粒粒径检测方法

Affilication of Author(s):中国科学技术大学

Disigner of the Invention:李迪,liyinmei,钟敏成,wangziqiang

Patent description:发明

Application Number:201410685965.9

Number of Inventors:5

Service Invention or Not:no

Publication Date:2015-02-25

Authorization Date:2017-02-22

First Author:zhoujinhua