中国科学技术大学 zhangjie--Home-- Shen, Y. and J. Zhang, 2019, Applying the refraction migration method to image a deep interface in Xinjiang, China: SEG Technical Program Expanded Abstracts 2019: pp. 4307-4311.

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Shen, Y. and J. Zhang, 2019, Applying the refraction migration method to image a deep interface in Xinjiang, China: SEG Technical Program Expanded Abstracts 2019: pp. 4307-4311.

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Pre One: Duan, X. and J. Zhang, 2019, Multi-trace and multi-attribute analysis for first-break picking with the support vector machine: SEG Technical Program Expanded Abstracts 2019: pp. 2559-2563.

Next One: Ma, Y. and J. Zhang, 2019, Joint inversion for microseismic event locations and anisotropic parameters with the cross double-difference method in VTI media: SEG Technical Program Expanded Abstracts 2019: pp. 3101-3105.