Yuan, C., X. Jia, S. Liu, and J. Zhang, 2017, Multiple crosscorrelation staining reverse time migration for high-resolution fracture imaging: SEG Technical Program Expanded Abstracts 2017, 2903-2907.
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上一条： Wang, Y., and J. Zhang, 2017, Applying refraction traveltime migration to image bedrock with high resolution: SEG Technical Program Expanded Abstracts 2017, 5443-5447.
下一条： Jiang, W., Z. Liu, and J. Zhang, 2017, Diffraction imaging using reverse time migration with poynting vectors: SEG Technical Program Expanded Abstracts 2017, 1028-1032.