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张磊

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Degree:Dr

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Absolute phase measurement with four patterns based on variant shifting phases[J]. Review of entific Instruments, 2020, 91(6):065115

Release time:2021-07-26

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Pre One:X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source[J]. Proc. of SPIE, 2020, Vol. 11492 114920Q-1
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