中国科学技术大学张磊--中文主页-- X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source[J]. Proc. of SPIE, 2020, Vol. 11492 114920Q-1

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X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source[J]. Proc. of SPIE, 2020, Vol. 11492 114920Q-1

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