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张增明

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Temperature dependent optical constants for SiO2 film on Si substrate by ellipsometry

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DOI number:10.1088/2053-1591/aa7d17

Journal:MATERIALS RESEARCH EXPRESS

Correspondence Author:zhangzengming

Document Code:000407035800005

Volume:4

Issue:8

ISSN No.:2053-1591

Translation or Not:no

Date of Publication:2017-07-31

Included Journals:SCI

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