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张增明

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Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance

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DOI number:10.1088/1674-1056/23/8/087802

Journal:CHINESE PHYSICS B

Correspondence Author:zhangzengming

Document Code:000343875300071

Volume:23

Issue:8

ISSN No.:1674-1056

Translation or Not:no

Date of Publication:2014-07-31

Included Journals:SCI

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