chenyuhang
- Associate professor
- Name (Pinyin):chenyuhang
- E-Mail:
- Contact Information:0551-63600214
- Degree:Dr
- Professional Title:Associate professor
- Teacher College:Engineering Science
Contact Information
- Telephone：
- Paper Publications
- chenyuhang.Double-hole cantilevers for harmonic atomic force microscopy.REVIEW OF SCIENTIFIC INSTRUMENTS,2017,88(10):
- chenyuhang.Cantilever optimization for applications in enhanced harmonic atomic force microscopy.SENSORS AND ACTUATORS A-PHYSICAL,2017,25554-60.
- chenyuhang,chenyuhang.Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy.MICROSCOPY AND MICROANALYSIS,2014,20(6):1682-1691.
- chenyuhang.Atomic force microscopy force-distance curves with small amplitude ultrasonic modulation.SCANNING,37(4):284-293.
- chenyuhang.Image contrast reversals in contact resonance atomic force microscopy.AIP ADVANCES,2015,5(2):
- chenyuhang.Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation.OPTICAL ENGINEERING,2014,53(12):
- chenyuhang.A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy.MEASUREMENT SCIENCE AND TECHNOLOGY,2013,24(2):
- chenyuhang,chenyuhang.Improving dimensional measurement from noisy atomic force microscopy images by non-local means filtering.SCANNING,38(2):113-120.
- chenyuhang.Visualizing Subsurface Defects in Graphite by Acoustic Atomic Force Microscopy.MICROSCOPY RESEARCH AND TECHNIQUE,2016,80(1):66-74.
- chenyuhang,chenyuhang.Focused Ion Beam Fabrication and Atomic Force Microscopy Characterization of Micro/Nanoroughness Artifacts With Specified Statistic Quantities.IEEE TRANSACTIONS ON NANOTECHNOLOGY,2014,13(3):563-573.