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DeepEIT: Deep Image Prior Enabled Electrical Impedance Tomography

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  • Impact Factor:20.4

  • DOI number:10.1109/tpami.2023.3240565

  • Journal:IEEE Transactions on Pattern Analysis and Machine Intelligence

  • First Author:Dong Liu

  • Co-author:Junwu Wang, Qianxue Shan, Danny Smyl,Jiansong Deng, Jiangfeng Du

  • Indexed by:Journal paper

  • Correspondence Author:Dong Liu

  • Discipline:Natural Science

  • Document Type:J

  • Volume:45

  • Issue:8

  • Page Number:9627-9638

  • ISSN No.:0162-8828

  • Translation or Not:no

  • Date of Publication:2023-02-01

  • Included Journals:SCI

  • Links to published journals:https://doi.org/10.1109/tpami.2023.3240565

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    • Attachments:

  • Liu2023DeepEIT.pdf   
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