一种极低温下半导体量子点低噪测量系统
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Affilication of Author(s):中国科学技术大学
Disigner of the Invention:guoguoping,李海鸥,caogang,xiaoming,guoguangcan
Patent description:发明
Application Number:201310125176.5
Number of Inventors:6
Service Invention or Not:no
Publication Date:2013-08-07
Authorization Date:2015-05-27
First Author:shangrunan
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