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一种极低温下半导体量子点低噪测量系统

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:guoguoping,李海鸥,caogang,xiaoming,guoguangcan

  • Patent description:发明

  • Application Number:201310125176.5

  • Number of Inventors:6

  • Service Invention or Not:no

  • Publication Date:2013-08-07

  • Authorization Date:2015-05-27

  • First Author:shangrunan


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