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电子元器件低温电学性能测试装置及方法

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  • Affilication of Author(s):中国科学技术大学

  • Disigner of the Invention:路腾腾,李臻,雒超

  • Patent description:发明

  • Application Number:201710979449.0

  • Number of Inventors:4

  • Service Invention or Not:no

  • Publication Date:2018-01-16

  • First Author:guoguoping

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