电子元器件低温电学性能测试装置
Hits:
Affilication of Author(s):中国科学技术大学
Disigner of the Invention:路腾腾,李臻,luochao
Patent description:实用新型
Application Number:201721350534.2
Number of Inventors:4
Service Invention or Not:no
Publication Date:2018-07-24
Authorization Date:2018-07-24
First Author:guoguoping
-
|
|