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The Instrument Bandwidth Effect in Jitter and BER Test for High-Speed Serial Interconnection

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  • Impact Factor:3.413

  • DOI number:10.1109/TMTT.2012.2228666

  • Journal:IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

  • First Author:Yang Junfeng

  • Correspondence Author:Yang Junfeng

  • Document Code:000313940300028

  • Volume:61

  • Issue:1

  • Page Number:256-262

  • ISSN No.:0018-9480

  • Translation or Not:no

  • Date of Publication:2012-12-31

  • Included Journals:SCI

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