The Instrument Bandwidth Effect in Jitter and BER Test for High-Speed Serial Interconnection

Impact Factor:3.413

DOI number:10.1109/TMTT.2012.2228666

Journal:IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

First Author:Yang Junfeng

Correspondence Author:Yang Junfeng

Document Code:000313940300028

Volume:61

Issue:1

Page Number:256-262

ISSN No.:0018-9480

Translation or Not:no

Date of Publication:2012-12-31

Included Journals:SCI