Zheng Jinjin

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14、Liu, R, JJ Zheng, HJ Zhou, YC Tian, G. Liu, and LG Shen (2007). A Generalized Dill Exposure Model for Negative Thick Photoresist, IEEE International Conference on Information Acquisition 2007,pp285-291. July9-11, Jeju Island, Korea. EI 收录
Release time:2021-07-24  Hits:

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