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 Boyu Li, Zongwei Zhu*, Weihong Liu, Qianyue Cao, Changlong Li, Cheng Ji, Xi Li, and Xuehai Zhou; Magnifer: A Chiplet Feature-Aware Test Case Generation Method for Deep Learning Accelerators. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2025, Accept. (CCF A 期刊)

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