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一种微放电器性能测试装置及方法
Release time:2021-07-23 Hits:
Affilication of Author(s): 中国科学技术大学
Disigner of the Invention: 何利文,chujiaru,王海
Patent description: 发明
Application Number: 201110412677.2
Number of Inventors: 4
Service Invention or Not: no
Publication Date: 2013-06-19
First Author: wenli