陈宇航  (副教授)

电子邮箱:

联系方式:0551-63600214

学位:博士

   
当前位置: 中文主页 >> 科学研究 >> 论文成果

Fabrication and characterization of areal roughness specimens for applications in scanning probe microscopy

点击次数:

DOI码:10.1088/0957-0233/24/5/055402

发表刊物:MEASUREMENT SCIENCE AND TECHNOLOGY

第一作者:陈宇航

通讯作者:陈宇航

论文编号:000317585600031

卷号:24

期号:5

ISSN号:0957-0233

是否译文:

发表时间:2013-04-30

收录刊物:SCI

上一条: Focused Ion Beam Fabrication and Atomic Force Microscopy Characterization of Micro/Nanoroughness Artifacts With Specified Statistic Quantities

下一条: Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy