- 陈宇航.Double-hole cantilevers for harmonic atomic force microscopy.REVIEW OF SCIENTIFIC INSTRUMENTS,2017,88(10):
- 陈宇航.Cantilever optimization for applications in enhanced harmonic atomic force microscopy.SENSORS AND ACTUATORS A-PHYSICAL,2017,25554-60.
- 陈宇航,陈宇航.Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy.MICROSCOPY AND MICROANALYSIS,2014,20(6):1682-1691.
- 陈宇航.Atomic force microscopy force-distance curves with small amplitude ultrasonic modulation.SCANNING,37(4):284-293.
- 陈宇航.Image contrast reversals in contact resonance atomic force microscopy.AIP ADVANCES,2015,5(2):
- 陈宇航.Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation.OPTICAL ENGINEERING,2014,53(12):
- 陈宇航.A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy.MEASUREMENT SCIENCE AND TECHNOLOGY,2013,24(2):
- 陈宇航,陈宇航.Improving dimensional measurement from noisy atomic force microscopy images by non-local means filtering.SCANNING,38(2):113-120.
- 陈宇航.Visualizing Subsurface Defects in Graphite by Acoustic Atomic Force Microscopy.MICROSCOPY RESEARCH AND TECHNIQUE,2016,80(1):66-74.
- 陈宇航,陈宇航.Focused Ion Beam Fabrication and Atomic Force Microscopy Characterization of Micro/Nanoroughness Artifacts With Specified Statistic Quantities.IEEE TRANSACTIONS ON NANOTECHNOLOGY,2014,13(3):563-573.