陈宇航  (副教授)

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学位:博士

   
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Visualizing Subsurface Defects in Graphite by Acoustic Atomic Force Microscopy

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影响因子:2.117

DOI码:10.1002/jemt.22668

发表刊物:MICROSCOPY RESEARCH AND TECHNIQUE

通讯作者:陈宇航

论文编号:000392092100008

卷号:80

期号:1

页面范围:66-74

ISSN号:1059-910X

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发表时间:2016-12-31

收录刊物:SCI

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