褚家如
Click:
The Founding Time:..
The Last Update Time:..
· Scan attention
·Paper Publications
4、Residual stress characterization of polycrystalline 3C-SiC films on Si(100) deposited from methylsilane, Journal of Applied Physics, v106, 2009, 013505
Release time:2021-07-25 Hits:
Translation or Not: no