Senior engineer
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Journal:Small Methods
Indexed by:Journal paper
Document Type:J
Volume:8
Issue:5
Page Number:2301364
Translation or Not:no
Date of Publication:2024-01-07
Included Journals:SCI
Pre One:Defect Engineering in Multilayer h-BN Based RRAM by Localized Helium Ion Irradiation
Next One:Enhancement of silicon sub-bandgap photodetection by helium-ion implantation
