Current position: Home >> Scientific Research >> Paper Publications
温晓镭

Personal Information

Senior engineer  

Paper Publications

Defect Engineering in Multilayer h-BN Based RRAM by Localized Helium Ion Irradiation

Hits:

Journal:IEEE Electron Device Letters

Indexed by:Journal paper

Document Type:J

Translation or Not:no

Date of Publication:2024-02-23

Pre One:Enhanced and directional fluorescence emission regulated by dual resonant surface modes

Next One:Helium Ion-Assisted Wet Etching of Silicon Carbide with Extremely Low Roughness for High-Quality Nanofabrication.

Copyright © 2013 University of Science and Technology of China.

Click : times
  • MOBILE Version
    •
    Open time:..
    The Last Update Time:..

    Mobile phone sweep