10. Y. Yin, X. Liu, X. Tang*, X. Xie, H. Wang, C. Zhao, S. Yang*, "Mechanism of frequency-dependent gate breakdown in p-GaN/AlGaN/GaN HEMTs," Appl. Phys. Lett., vol. 125, no. 17, Art. no. 173506, Oct. 2024
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上一条： 9. K. Tan, M. Luo, J. Jiang, X. Tang*, S. Yang, C. Hu, W. Cao*, "Impact of Structural Variation in SiC MOSFETs on TSEP Performances for Temperature Estimation," IEEE Trans. Electron Devices, 2025
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