9. J. Du, H. Lin, D. Hou, S. Long, S. Yang*, "Ultrafast junction temperature mapping during surge current transient and thermal management in vertical GaN PiN diode," 37th IEEE Int. Symp. on Power Semiconductor Devices and ICs (ISPSD), 2025
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上一条： 8. C. Chu, X. Xie, J. Wang, Z. Wang, M. Wang, H. Zhang, X. Tang*, S. Long and S. Yang*, "γ-Ray Irradiation-Induced Dynamic Ron Degradation in P-GaN Gate HEMT: Role of Surface Trapping," 38th IEEE Int. Symp. on Power Semiconductor Devices and ICs (ISPSD), 2026
下一条： 10. X. Xie, M. Wang, Z. Wang, Z. Wang, C. Chu, G. Xu, S. Long, S. Yang*, "Enhanced Single-Event Hardness in GaN-on-Si HEMT With Gate-Junction Termination Extension," 37th Int. Symp. on Power Semiconductor Devices and ICs (ISPSD), 2025